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Measurement with X-ray spectrometer

  • Type of device: Spektrometr VANTA VCA
  • Accurate and non-destructive compositional analysis
  • Result: chemical composition report and image documentation

X-ray spectrometer

Nový spektometr VANTA


The new  logo VANTAspectrometer is a fast and accurate, battery-powered ED-XRF spectrometer designed for RoHS/RoHS2/WEEE screening of products and raw materials. It is intended for accurate and immediate determination of compliance with the directives. The spectrometer measures both homogenous and heterogeneous objects, and thanks to the integrated camera and focusing, it is possible to focus on small components or individual SMD components. 

Intended use

  • Fast and accurate non-destructive analysis of chemical composition of both metallic and non-metallic materials.
  • Immediate analysis of chemical composition of the measured material and compliance with the standard.
  • Measurement of galvanic plating thickness using the Coating mode.
  • The output of the measurement is both the chemical composition and the verdict of compliance / non-compliance with the directive. The chemical composition is determined for the following elements: Cr, Hg, Pb, Br, Cd, plus Cl, Ti, Fe, Co, Ni, Cu, Zn, As, Bi, Se, Sn, Sb.

The analysis can be supplemented with other elements: Cl, Ca, V, Mn, Se, Br, Sr, Zr, Nb, Mo, Ag, Cd, Hf, Ta, W, Ba, Au, Bi, LE.

  • The output protocol, together with the results of the analysis, also includes photographic documentation of the measured object.

Coating mode is used to determine the thickness of galvanic plating in µm from the point of view of the following surface layers: Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, W, Hf, Ta, Re, Pb, Bi, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Au.

Non-binding request

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Allowed types: pdf, doc, docx, xls, xlsx, rar, zip, dwg.