The new spectrometer is a fast and accurate, battery-powered ED-XRF spectrometer designed for RoHS/RoHS2/WEEE screening of products and raw materials. It is intended for accurate and immediate determination of compliance with the directives. The spectrometer measures both homogenous and heterogeneous objects, and thanks to the integrated camera and focusing, it is possible to focus on small components or individual SMD components.
The analysis can be supplemented with other elements: Cl, Ca, V, Mn, Se, Br, Sr, Zr, Nb, Mo, Ag, Cd, Hf, Ta, W, Ba, Au, Bi, LE.
Coating mode is used to determine the thickness of galvanic plating in µm from the point of view of the following surface layers: Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, W, Hf, Ta, Re, Pb, Bi, Zr, Nb, Mo, Pd, Ag, Cd, Sn, Sb, Au.